09:00 - 17:00

Workshop on Electromigration Reliability

EI9

17:00 - 19:00

Registration

08:00 - 10:00

Registration

08:40 - 08:50

Conference Opening

EI7

08:50 - 09:35

Plenary Session by Mark Pinto

EI7

09:40 - 10:40

Session 1A: Process Simulation I

EI7

09:40 - 10:40

Session 1B: Strain I

EI9

10:40 - 11:00

Coffee

11:00 - 13:00

Session 2A: Process Simulation II

EI7

11:00 - 13:00

Session 2B: Electronic Transport I

EI9

13:30 - 15:00

Lunch

15:00 - 19:00

Poster Session & Get Together Party

Faculty Meeting Room

08:30 - 09:15

Plenary Session by Peter Pichler

EI7

09:20 - 10:40

Session 3A: Noise & Fluctuations

EI7

09:20 - 10:40

Session 3B: Strain II

EI9

10:40 - 11:00

Coffee

11:00 - 13:00

Session 4A: Technology & Device Design

EI7

11:00 - 13:00

Session 4B: First Principle Methods

EI9

13:30 - 15:00

Lunch

15:00 - 15:45

Plenary Session Rossella Brunetti

EI7

15:50 - 17:10

Session 5A: SiC & Power Devices

EI7

15:50 - 17:10

Session 5B: Electronic Transport II

EI9

19:00 - 22:00

Conference Banquet

Schönbrunn Palace

08:30 - 09:15

Plenary Session by Toshiro Hiramoto

EI7

09:20 - 10:40

Session 6A: Future Devices

EI7

09:20 - 10:40

Session 6B: Optical Devices

EI9

10:40 - 11:00

Coffee

11:00 - 13:00

Session 7A: Future Devices II & Numerics

EI7

11:00 - 13:00

Session 7B: III-V Devices

EI9

13:30 - 15:00

Lunch

15:00 - 15:45

Plenary Session by Chenming Calvin Hu

EI7

15:50 - 17:10

Session 8: Compact Modeling

EI7

17:10

Conference Closing

EI7

09:00 - 17:00

Workshop on Organic Electronics

EI9