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Sani Nassif

Abstract

Title: Impact of Statistical Variability and Reliability on Circuit Design

Bios

Sani received his PhD from Carnegie-Mellon university in the eighties. He worked for ten years at Bell Laboratories on various aspects of design and technology coupling including device modeling, parameter extraction, worst case analysis, design optimization and circuit simulation. He joined the IBM Austin Research Laboratory in January 1996 where he is presently managing the Silicon Analytics Department, which is focused on design/technology coupling and includes activities in: model to hardware matching, simulation and modeling, statistical modeling, statistical technology characterization and related areas. Sani is a fellow of the IEEE, a member of the IBM Academy of Technology, and holds 44 US and international patents.