H. Agarwal, S. Venugopalan, M. Chalkiadaki, N. Paydavosi, J. Duarte, S. Agnihotri, C. Yadav, P. Kushwaha, Y. Chauhan, C. Enz, A. Niknejad, C. Hu: "Recent Enhancements in BSIM6 Bulk MOSFET Model"; Talk: Conference, Glasgow, UK; 2013-09-03 - 2013-09-05; in: "Proc. of SISPAD", (2013), 53 - 56.
O. Baumgartner, M. Bina, W. Gös, M. Toledano-Luque, B. Kaczer, H. Kosina, T. Grasser: "Direct Tunneling and Gate Current Fluctuations"; Talk: Conference, Glasgow, UK; 2013-09-03 - 2013-09-05; in: "Proc. of SISPAD", (2013), 17 - 20.
B. Cipriany, B. Jagannathan, G. Costrini, A. Noemaun, K. Onishi, S. Narasimha, N. Zhan, H. Nanjundappa, J. Norum, S. Furkay, R. Malik, P. Agnello, D. Fried, K. Greiner, D. Faken, S. Breit: "22nm Technology Yield Optimization Using Multivariate 3D Virtual Fabrication"; Talk: Conference, Glasgow, UK; 2013-09-03 - 2013-09-05; in: "Proc. of SISPAD", (2013), 97 - 100.
P. Dorion, O. Cueto, M. Reyboz, E. Vianello, J.C. Barbe, A. Grigoriu, Y. Maday: "Simulation of CBRAM devices with the level set method"; Talk: Conference, Glasgow, UK; 2013-09-03 - 2013-09-05; in: "Proc. of SISPAD", (2013), 340 - 343.
L. Filipovic, S. Selberherr, G. Mutinati, E. Brunet, S. Steinhauer, A. Köck, J. Kraft, J. Siegert, F. Schrank, C. Gspan, W. Grogger: "Modeling the Growth of Thin SnO2 Films using Spray Pyrolysis Deposition"; Poster: Conference, Glasgow, UK; 2013-09-03 - 2013-09-05; in: "Proc. of SISPAD", (2013), 208 - 211.
A. Gencer, D. Tsamados, V. Moroz: "Fin Bending due to Stress and its Simulation"; Talk: Conference, Glasgow, UK; 2013-09-03 - 2013-09-05; in: "Proc. of SISPAD", (2013), 109 - 112.
B. Kaczer, V. Afanas´ev, K. Rott, F. Cerbu, J. Franco, W. Gös, T. Grasser, O. Madia, A. Nguyen, A. Stesmans, H. Reisinger, M. Toledano-Luque, P. Weckx: "Experimental characterization of BTI defects"; Talk: Conference, Glasgow, UK; 2013-09-03 - 2013-09-05; in: "Proc. of SISPAD (MORDRED Workshop)", (2013), 444 - 450.
D. Lu, J. Chang, M. Guillorn, C.-H. Lin, J. Johnson, P. Oldiges, K. Rim, M. Khare, W. Haensch: "A Comparative Study of Fin-Last and Fin-First SOI FinFETs"; Talk: Conference, Glasgow, UK; 2013-09-03 - 2013-09-05; in: "Proc. of SISPAD", (2013), 147 - 150.
A. Singulani, H. Ceric, S. Selberherr: "Stress Estimation in Open Tungsten TSV"; Talk: Conference, Glasgow, UK; 2013-09-03 - 2013-09-05; in: "Proc. of SISPAD", (2013), 65 - 68.
W. Zisser, H. Ceric, R.L. de Orio, S. Selberherr: "Electromigration Analyses of Open TSVs"; Poster: Conference, Glasgow, UK; 2013-09-03 - 2013-09-05; in: "Proc. of SISPAD", (2013), 244 - 247.