L. De Marchi, E. Baravelli, F. Franze, N. Speciale: "3D Mesh Generation with Wavelet-Driven Adaptivity"; Poster: Conference, Monterey, USA; 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 212 - 215.
X. Fan, L.F. Register, B. Ghosh, S.K. Banerjee, B. Winstead, U. Ravaioli: "Scalability of Biaxially Strained Si NMOS on Technology Roadmap"; Poster: Conference, Monterey, USA; 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 232 - 235.
P. Fantini, A. Benvenuti, A. Pirovano, F. Pellizzer, D. Ventrice, G. Ferrari: "A Compact Model for Phase Change Memories"; Talk: Conference, Monterey, USA; 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 162 - 165.
M. Fujinaga, S. Itoh, M. Mochiduki, T. Uchida, H. Ishikawa, M. Takenaka, C.J. Park, S. Asada, T. Shinzawa, J. Namekata, S. Wakahara, T. Wada: "3D Process Simulation of CMOS Inverter Based on Selete 65nm Full Process"; Talk: Conference, Monterey, USA; 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 373 - 376.
T. Grasser, R. Entner, O. Triebl, R. Minixhofer: "TCAD Modeling of Negative Bias Temperature Instability"; Talk: Conference, Monterey, USA; 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 330 - 333.
S. Johnson, Y. Avniel, J. White, S. Boyd: "Design Tools for Emerging Technologies"; Talk: Conference, Monterey, USA (invited); 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 1 - 4.
C. Jungemann, B. Meinerzhagen: "Numerical Simulation of RF Noise in Si Devices"; Talk: Conference, Monterey, USA (invited); 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 87 - 94.
T. Kanemura, T. Izumida, N. Aoki, M. Kondo, S. Ito, T. Enda, K. Okano, H. Kawasaki, A. Yagishita, A. Kaneko, S. Inaba, M. Nakamura, K. Ishimaru, K. Suguro, K. Eguchi, H. Ishiuchi: "Improvement of Drive Current in Bulk FinFET Using Full 3D Process/Device Simulations"; Talk: Conference, Monterey, USA; 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 131 - 134.
D. Kimpton, M. Baida, V. Zhuk, M. Temkin, I. Chakarov: "Multiple Type Grid Approach for 3D Process Simulation"; Talk: Conference, Monterey, USA; 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 369 - 372.
T.A. Kirichenko, D. Yu, G.S. Hwang, S.K. Banerjee: "Vacancy at Si-SiO2 Interface: Ab-Initio Study"; Talk: Conference, Monterey, USA; 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 147 - 149.
K.V. Loiko, V. Adams, D. Tekleab, B. Winstead, X.-Z. Bo, P. Grudowski, S. Goktepeli, S. Filipiak, B. Goolsby, V. Kolagunta, M.C. Foisy: "Multilayer Model for Stressor Film Deposition"; Talk: Conference, Monterey, USA; 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 123 - 126.
A. Martinez, J.R. Barker, A. Asenov, M. Bescond, A. Svizhenko, A. Anantram: "Development of a Full 3D NEGF Nano-CMOS Simulator"; Talk: Conference, Monterey, USA; 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 353 - 356.
B. Obradovic, R. Kotlyar, F.O. Heinz, P. Matagne, T. Rakshit, D. Nikonov, M.A. Stettler: "Carbon Nanoribbons: An Alternative to Carbon Nanotubes"; Talk: Conference, Monterey, USA; 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 27 - 30.
P. Sakalas, A. Chakravorty, M. Schroter, M. Ramonas, J. Herricht, A. Shimukovitch, C. Jungemann: "Modeling of High Frequency Noise in SiGe HBTs"; Poster: Conference, Monterey, USA; 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 271 - 274.
K. Shiraishi, H. Takeuchi, Y. Akasaka, H. Watanabe, N. Umezawa, T. Chikyow, Y. Nara, T-J.K. Liu, K. Yamada: "Theory of Fermi Level Pinning of High-Κ Dielectrics"; Talk: Conference, Monterey, USA (invited); 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 306 - 313.
H. Tanimoto, M. Kondo, T. Enda, N. Aoki, R. Iijima, T. Watanabe, M. Takayanagi, H. Ishiuchi: "Modeling of Electron Mobility Degradation for HfSiON MISFETs"; Talk: Conference, Monterey, USA; 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 47 - 50.
D. Tekleab, V. Adams, K. Loiko, B. Winstead, S. Parsons, P. Grudowski: "Stress Sensitivity of p-MOSFET under High Mechanical Stress"; Talk: Conference, Monterey, USA; 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 119 - 122.
T. Warabino, M. Miyake, N. Sadachika, D. Navarro, Y. Takeda, G. Suzuki, T. Ezaki, M. Miura-Mattausch, H.J. Mattausch, T. Ohguro, T. Iizuka, M. Taguchi, S. Kumashiro, S. Miyamoto: "Analysis and Compact Modeling of MOSFET High-Frequency Noise"; Talk: Conference, Monterey, USA; 2006-09-06 - 2006-09-08; in: "Proc. of SISPAD", (2006), 1-4244-0404-5; 158 - 161.