SISPAD 2001 Proceedings
- A.C. Aarts, M.J. Swanenberg, W.J. Kloosterman:
"Modeling of High-Voltage SOI-LDMOS Transistors Including Self-Heating";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 246 - 249. - D.A. Antoniadis, V. Djomehri, A. Lochtefeld:
"Electron Velocity in Sub-50nm Channel MOSFETs";
Talk: Conference, Athens, Greece (invited); 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 156 - 161. - B. Ardouin, T. Zimmer, H. Mnif, P. Fouillat:
"Bipolar Transistor's Intrinsic and Extrinsic Capacitance Determination";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 304 - 307. - A. Asenov:
"3D Statistical Simulation of Intrinsic Fluctuations in Decanano MOSFETs Introduced by Discrete Dopants, Oxide Thickness Fluctuations and LER";
Talk: Conference, Athens, Greece (invited); 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 162 - 169. - V. Axelrad, Y. Huh, W.-H. Chen, P. Bendix:
"Investigations of Salicided and Salicide-Blocked MOSFETs for ESD Including ESD Simulation";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 300 - 303. - M. Bucher, J.-M. Sallese, C. Lallement:
"Accounting for Quantum Effects and Polysilicon Depletion in an Analytical Design-Oriented MOSFET Model";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 296 - 299. - F.M. Bufler, A. Schenk, W. Fichtner:
"Simplified Inelastic Acoustic-Phonon Hole Scattering Model for Silicon";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 42 - 45. - A. Burenkov, Y. Mu, H. Rysse:
"On the Effect of Local Electronic Stopping on Ion Implantation Profiles in Non-Crystalline Targets";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 70 - 73. - J. Cervenka, M. Knaipp, A. Hössinger, S. Selberherr:
"Green's Function Approach for Three-Dimensional Diffusion Simulation of Industrial High-Voltage Applications";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 408 - 411. - D. Connelly:
"Decananometer FDSOI Device Optimization Including Random Variation";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 90 - 93. - N.E. Cowern, F. Roozeboom, P. Van der Sluis:
"Investigation of a Novel Rapid Thermal Processing Concept Using an Electro-Optically Controlled Radiation Cavity";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 344 - 347. - F. Cristiano, B. Colombeau, C. Bonafos, J. Aussoleil, G. Assayag, A. Claverie:
"Atomistic Simulations of Extrinsic Defects Evolution and Transient Enhanced Diffusion in Silicon";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 30 - 33. - C. Dai, N. Hakim, S. Walstra, S. Hareland, J. Maiz, S. Yu, S.-W. Lee:
"Neutron-SER Modeling and Simulation for 0.18μm CMOS Technology";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 278 - 283. - M. Dauelsberg, M. Deufel, M. Reinhold, G. Strauch, T. Bergunde:
"Equipment and Process Simulation of Compound Semiconductor MOCVD in the Production Scale Multiwafer Planetary Reactor";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 128 - 131. - I. De, A. Shibkov, S. Saxena:
"Robust Method for Fast and Accurate Simulation of Random Dopant Fluctuation Induced Vth-Variation in MOSFETs with Arbitrary Complex Doping Distribution";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 368 - 371. - S. Decker, C. Jungemann, B. Neinhüs, B. Meinerzhagen:
"2D Hierarchical Radio-Frequency Noise Modeling Based on a Langevin-Type Drift-Diffusion Model and Full-Band Monte Carlo Generated Local Noise Sources";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 136 - 139. - K. Dragosits, Y. Ponomarev, C. Dachs, S. Selberherr:
"Analysis of Ultra-Short MOSFETs with High-Κ Gate Dielectrics";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 412 - 415. - S.T. Dunham, Z. Qin:
"Acceleration of Lattice Monte Carlo Simulations and Application to Diffusion/Clustering of As at High Concentrations";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 116 - 119. - J. Fu, S. Mijalkovic, W.J. Eysenga, H.W. Van Zeijl, W. Crans:
"Varying Characteristics of Bipolar Transistors with Emitter Contact Window Width";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 308 - 311. - Y. Fujii, R. Yoshimura, T. Matsuoka, K. Taniguchi:
"Compact Device Model for Partially Depleted SOI MOSFETs";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 234 - 237. - A. Gehring, C. Heitzinger, T. Grasser, S. Selberherr:
"TCAD Analysis of Gain Cell Retention Time for SRAM Applications";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 416 - 419. - E. Gnani, S. Reggiani, M. Rudan:
"Density of States and Group Velocity Calculations for SiO2";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 50 - 53. - C. Gonzales Montes De Oca, S. Foley, A. Mathewson, J.F. Rohan:
"Stress Modeling of Multi Level Interconnect Schemes for Future Deep Submicron Device Generations";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 364 - 367. - J.-S. Goo, S. Donati, C.-H. Choi, Z. Yu, T.H. Lee, R.W. Dutton:
"Impact of Substrate Resistance on Drain Current Noise in MOSFETs";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 182 - 185. - B. Govoreanu, P. Blomme, M. Rosmeulen, J. Van Houdt, K. De Meyer:
"A Figure of Merit for Flash Memory Multilayer Tunnel Dielectrics";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 270 - 273. - T. Grasser, H. Kosina, S. Selberherr:
"An Impact Ionization Model Including Non-Maxwellian and Non-Parabolicity Effects";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 46 - 49. - T. Grasser, H. Kosina, S. Selberherr:
"Investigation of Spurious Velocity Overshoot Using Monte Carlo Data";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 54 - 57. - S. Hamaguchi, H. Ohta:
"Modeling of Reactive Ion Etching for Si/SiO2 Systems";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 170 - 173. - M. Hane, T. Ikezawa, G.H. Gilmer:
"Monte Carlo Impurity Diffusion Simulation Considering Charged Species";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 18 - 21. - C. Harlander, R. Sabelka, S. Selberherr:
"A Comparative Study of Two Numerical Techniques for Inductance Calculation in Interconnect Structures";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 254 - 257. - C. Heitzinger, S. Selberherr:
"Optimization for TCAD Purposes Using Bernstein Polynomials";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 420 - 423. - S. Ho, Y. Dhkura, M. Ikegawa, N. Mise, J. Prasad, Y. Kawashima, S. Kubo:
"An Agent-Based Common Software Platform Applied to Multiscale Device and Process Simulations";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 372 - 375. - G. Hobler, V. Moroz:
"Initial Conditions for Transient Enhanced Diffusion: Beyond the Plus-Factor Approach";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 34 - 37. - J. Höntschel, R. Stenzel, W. Klix, F. Ertl, T. Asperger, R.A. Deutschmann, M. Bichler, G. Abstreiter:
"Simulation of Vertical CEO-FETs by a Coupled Solution of the Schrödinger Equation with a Hydrodynamic Transport Model";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 222 - 225. - A. Hössinger, T. Binder, W. Pyka, S. Selberherr:
"Advanced Hybrid Cellular-Based Approach for Three-Dimensional Etching and Deposition Simulation";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 424 - 427. - C.-K. Huang, N. Goldsman:
"2D Self-Consistent Solution of Schrödinger Equation, Boltzmann Transport Equation, Poisson and Current-Continuity Equation for MOSFET";
Talk: Conference, Athens, Greece; 2001-09-05 - 0000-00-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 148 - 151. - K.-Y. Huang, Y. Li, C.P. Lee, S.M. Sze:
"A Computational Efficient Method for HBT Intermodulation Distortions and Two-Tone Characteristics Simulation";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 226 - 229. - A. Icaza Deckelmann, G. Wachutka, G. Groos, W. Kanert:
"Electrothermal Device Simulation of an ESD Protection Structure Based on Bipolar DC Characteristcs";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 396 - 399. - M.-K. Ieong, R. Young, H. Park, W. Rausch, I. Yang, S. Fung, F. Assaderaghi, H.-S. Wong:
"Modeling the Impact of Body-to-Body Leakage in Partially Depleted SOI CMOS Technology";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 230 - 233. - J.C. Jackson, B. Lane, A. Mathewson, A.P. Morrison:
"Simulation of Dark Count in Geiger Mode Avalanche Photodiodes";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 376 - 379. - J. Jakumeit, U. Ravaioli:
"Local Iterative Monte Carlo Investigation of the Influence of Electron-Electron Scattering on Short Channel Si MOSFETs";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 38 - 41. - M. Jaraiz, P. Castrillo, R. Pinacho, I. Martin-Bragado, J. Barbolla:
"Atomistic Front-End Process Modeling: A Powerful Tool for Deep Submicron Device Fabrication";
Talk: Conference, Athens, Greece (invited); 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 10 - 17. - S.K. Jones, D.J. Bazley, E. Augendre, G. Badenes, A. Keersgieter, T. Skotnicki:
"A Simulation Evaluation of 100nm CMOS Device Performance";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 288 - 291. - R.V. Joshi, S.S. Kang, C.-T. Chuang:
"3D Thermal Analysis for SOI and its Impact on Circuit Performance";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 242 - 245. - W. Kaindl, G. Wachutka, G. Sölkner:
"Modeling and Simulation of Charge Generation Events Caused by Ion Irradiation in High-Voltage Power Devices";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 436 - 439. - Y. Kamakura, K. Deguchi, K. Taniguchi:
"Analysis of Hot Carrier Induced Oxide Degradation in MOSFETs by Means of Full-Band Monte Carlo Simulation";
Talk: Conference, Athens, Greece (invited); 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 108 - 115. - S. Kaya, A. R. Brown, A. Asenov, D. Magot, T. Linton:
"Analysis of Statistical Fluctuations due to Line Edge Roughness in Sub-0.1μm MOSFETs";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 78 - 81. - M.G. Khazhinsky, A. Hoefler, M. Stockinger, D.J. Collins, I. Clejan, K. Wimmer, W. Taylor, M. Foisy, J.M. Higman, L. Bomholt, C. Chimencon, O. Zuyakova, W. Fichtner:
"A Shared Architecture for a Dynamic Technology Simulation Repository";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 348 - 351. - T-K. Kim, Y.P. Kim, W-Y. Chung, Y.-K. Park, L. Kong:
"Comparison of Finite Element Stress Simulation with X-Ray Measurement for the Aluminum Conductors with Different Passivation Topography";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 258 - 261. - Y. Kim, S. Yoon, I. Choi, S. Park, O. Kwon, T. Won:
"A Full-Wave Analysis for Multilevel Interconnects Using FDTD-PML Method";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 336 - 339. - D. Kitamaru, H. Veno, K. Morikawa, M. Tanaka, M. Miura-Mattausch, H.I. Mattausch, S. Kumashiro, T. Yamaguchi, K. Yamashita, N. Nakayama:
"Vth-Model of Pocket-Implant MOSFETs for Circuit Simulation";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 392 - 395. - G. Kokkoris, E. Gogolides, A.G. Boudouvis:
"Simulation and Prediction of Aspect Ratio Dependent Phenomena during SiO2 and Si Feature Etching in Fluorocarbon Plasmas";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 174 - 177. - H. Kosina, M. Nedjalkov, S. Selberherr:
"Variance and Covariance Estimation in Stationary Monte Carlo Device Simulation";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 140 - 143. - O. Kwon, T. Won:
"Level Set Modeling of Profile Evolution during Deposition Process";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 352 - 355. - A. La Magna, S. Coffa, S. Libertino, M. Strobe, L. Colombo:
"Interstitial Cluster Evolution and Transient Phenomena in Si Crystal";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 120 - 123. - L. Larcher, P. Pavan, M. Cuozzo, A. Marmiroli:
"A New Compact Spice-Like Model of E2PROM Memory Cells Suitable for DC and Transient Simulations";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 262 - 265. - F.G. Lau, W. Molzer:
"Dynamics of p+-Polysilicon Gate Depletion due to the Formation of Boron Compounds in TiSi2";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 74 - 77. - J. Lee, W-S. Cheong, J.-H. Choi, J.-C. Om:
"Enhanced Diffusion of Phosphorus due to BPSG Layer in SEG-MOSFETs";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 274 - 277. - K.-I. Lee, J. Kim, H. Shin, C. Lee, Y.-J. Park, H.S. Min:
"An Efficient Frequency-Domain Analysis Technique of MOSFET Operation";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 186 - 189. - D. Li, G. Wang, Y. Chen, G. Shrivastav, S. Oak, A. Tasch, S. Banerjee:
"A Computationally Efficient Model for Three-Dimensional Monte Carlo Simulation of Ion Implantation into Complex Structures";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 332 - 335. - Y. Li, O. Voskoboynikov, C.P. Lee, S.M. Sze:
"A Nonlinear Iterative Method for InAs/GaAs Semiconductor Quantum Dots Simulation";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 324 - 327. - Y. Ma, L. Chen, B. Jiang, M. Zhang, L. Tian, Z. Yu, L. Liu, Z. Li:
"Simulation of Advanced n-MOSFET Emphasizing Quantum Mechanical Effects on 2D Characteristics";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 388 - 391. - P. Maffezzoni, A. Brambilla, A.L. Lacaita:
"An Efficient Tool for Extraction of Interconnect Models in Submicron Layouts";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 250 - 253. - L.A. Marques, L. Pelaz, J. Hernendez, J. Barbolla:
"The Role of Incomplete Interstitial-Vacancy Recombination on Silicon Amorphization";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 26 - 29. - K. Matsuzawa, T. Ishihara:
"Simulation of Flash Memory Programming Characteristics";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 266 - 269. - K. Matsuzawa, K. Uchida, A. Nishiyama, T. Numata, M. Noguchi:
"Device Simulation and Measurement of Hybrid SBTT";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 380 - 383. - N. Miura, H. Hayashi, H. Komatsubara, M. Mochizuki, H. Matsuhashi, Y. Kajita:
"TCAD Driven Process Design of 0.15μm Fully Depleted SOI Transistor for Low Power Applications";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 284 - 287. - H. Nah, Y.I. Park, H.S. Min, C. Lee, H. Shin:
"Characterization of Low-Frequency Noise of MOSFETs Using the 2D Device Simulator";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 400 - 403. - M. Nedjalkov, T. Grasser, H. Kosina, S. Selberherr:
"Boundary Condition Models for Terminal Current Fluctuations";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 152 - 155. - H.-E. Nilsson, A. Martinez, M. Hjelm, E. Bellotti, K. Brennan:
"Monte Carlo Simulation of Multi-Band Carrier Transport in Semiconductor Materials with Complex Unit Cells";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 214 - 217. - M. Ogawa, T. Tanroku Miyoshi:
"Analysis of Gate Tunneling Current in MOS Structures Using Quantum Mechanical Simulation";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 144 - 147. - P. Oldiges, X. Wang, M.-K. Ieong, S. Fischer, K. Rim:
"A Practical Approach to Modeling Strained Silicon NMOS Devices";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 292 - 295. - A. Pakfar, A. Poncet, T. Schwartzmann, H. Jaouen:
"A Unified Model of Dopant Diffusion in SiGe";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 62 - 65. - V. Palankovski, N. Belova, T. Grasser, H. Puchner, S. Aronowitz, S. Selberherr:
"A Methodology for Deep Sub-Quartermicron CMOS Technology Characterization";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 428 - 431. - G. Pennington, N. Goldsman:
"Modeling Semiconductor Carbon Nanotube Rectifying Heterojunctions";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 218 - 221. - A. Pirovano, A.L. Lacaita, A.S. Spinelli:
"Fully 2D Quantum-Mechanical Simulation of Nanoscale MOSFETs";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 94 - 97. - A. Poncet, B. Vergnet, M. Mouis:
"Finite Element Simulation of 2D Quantum Effects in Ultra-Short Channel MOSFETs with High-Κ Dielectric Gates";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 86 - 89. - W. Pyka, C. Heitzinger, N. Tamaoki, T. Takase, T. Ohmine, S. Selberherr:
"Monitoring Arsenic In-Situ Doping with Advanced Models for Polysilicon CVD";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 124 - 127. - R. Quay, R. Schultheis, W. Kellner, V. Palankovski, S. Selberherr:
"A Review of Modeling Issues for RF Heterostructure Device Simulation";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 432 - 435. - K. Rajendran, W. Schoenmaker:
"A Simple Modeling and Simulation of Complete Suppression of Boron Out-Diffusion in Si1-xGex by Carbon Insertion";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 66 - 69. - I. Raptis, N. Glezos:
"Electron Beam Lithography Simulation for Sub-Quartermicron and High-Density Patterns";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 404 - 407. - C. Ravariu, F. Ravariu, A. Rusu, D. Dobrescu, L. Dobrescu:
"The Modeling of a SOl Micro-Electromechanical Sensor";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 328 - 331. - C.A. Richter, E.M. Vogel, A.M. Hodge, A.R. Hefner:
"Differences between Quantum-Mechanical Capacitance-Voltage Simulators";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 340 - 343. - M. Ryzhii, V. Ryzhii:
"Ensemble Monte Carlo Particle Modeling of InGaAs/lnP Uni-Traveling Carrier Photodiodes";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 312 - 315. - R. Sattler, G. Wachutka, F. Plötz, S. Hoffmann:
"System Level Modeling of an Electrostatic Torsional Actuator";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 178 - 181. - W. Schoenmaker, P. Meuris, W. Magnus:
"Ab-Initio Electrodynamic Modeling of On-Chip Back-End Structures";
Talk: Conference, Athens, Greece (invited); 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 98 - 107. - A.J. Scholten, R. Van Langevelde, L.F. Tiemeijer, R.J. Havens, D.B. Klaassen:
"Compact MOS Modeling for RF CMOS Circuit Simulation";
Talk: Conference, Athens, Greece (invited); 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 194 - 201. - V. Senez, T. Hoffmann:
"Elasto-Plastic Modeling of Microelectronics Materials for Accurate Prediction of the Mechanical Stresses in Advanced Silicon Technologies";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 58 - 61. - E.N. Shauly, R. Ghez, Y.I. Komem:
"Two-Dimensional Diffusion Characterization of Boron in Silicon Using Reverse Modeling";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 384 - 387. - N. Shigyo:
"Statistical Analysis of VLSI Using TCAD";
Talk: Conference, Athens, Greece (invited); 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 202 - 209. - S-P. Sim, P. Guo, B. Lee, C.-M. Liu, K.-K. Lee, C.Y. Yang:
"Parameter and Coupling Ratio Extraction for SPICE-Compatible MACRO Modeling of Source Side Injection (SSI) Flash Cell";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 356 - 359. - K. Sonoda, M. Tanizawa, K. Eikyu, K. Ishikawa, T. Kumamoto, H. Kouno, M. Inuishi:
"Modeling of Bias Dependent Fluctuations of Flicker Noise of MOSFETs";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 190 - 193. - B. Soree, W. Magnus, W. Schoenmaker:
"Quantum Mechanical Balance Equations for Modeling Transport in Closed Electric Circuits";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 320 - 323. - T. Tatsumi:
"An Effective Methodology for Predicting the Distribution of MOSFET Device Characteristics Using Statistical TCAD Simulations";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 316 - 319. - V. Theonas, G. Papaioannou:
"Theoretical Calculation of a Charged Particle Detector's Response, Fabricated by Semi-Insulating GaAs";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 360 - 363. - H. Van Meer, K. De Meyer:
"Two-Dimensional Model for the Subthreshold Slope in Deep Submicron Fully Depleted SOI MOSFETs";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 238 - 241. - D. Villanueva, P. Moens, K. Rajendran, W. Schoenmaker:
"A Novel Model for Boron Diffusion in SiGe Strained Layers Based on a Kinetics Driven Ge-B Pairing Mechanism";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 22 - 25. - A.T. Voutsas, H. Kisdarjono, R. Solanki, A. Kumar:
"Numerical Simulation of Non-Equilibrium, Ultra-Rapid Heating of Si Thin Films by Nanosecond-Pulse Excimer Laser";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 132 - 135. - K. Vutova, G. Mladenov, I. Raptis:
"Determination of the Radiation Efficiency, Contrast and Sensitivity in Electron and Ion Lithography";
Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 440 - 443. - A. Wakabayashi, Y. Mitani, D. Kasai, K. Horio:
"Numerical Modeling of Impact-Ionization Effects on Gate-Lag Phenomena in GaAs MESFETs";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 210 - 213. - J.R. Watling, A. R. Brown, A. Asenov, D.K. Ferry:
"Quantum Corrections in 3D Drift-Diffusion Simulations of Decanano MOSFETs Using an Effective Potential";
Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 82 - 85. - Z. Yu, R.W. Dutton, D.W. Yergeau, M.G. Ancona:
"Macroscopic Quantum Carrier Transport Modeling";
Talk: Conference, Athens, Greece (invited); 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 1 - 9.