C. Dai, N. Hakim, S. Walstra, S. Hareland, J. Maiz, S. Yu, S.-W. Lee: "Neutron-SER Modeling and Simulation for 0.18μm CMOS Technology"; Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 278 - 283.
Y. Fujii, R. Yoshimura, T. Matsuoka, K. Taniguchi: "Compact Device Model for Partially Depleted SOI MOSFETs"; Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 234 - 237.
M.G. Khazhinsky, A. Hoefler, M. Stockinger, D.J. Collins, I. Clejan, K. Wimmer, W. Taylor, M. Foisy, J.M. Higman, L. Bomholt, C. Chimencon, O. Zuyakova, W. Fichtner: "A Shared Architecture for a Dynamic Technology Simulation Repository"; Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 348 - 351.
D. Kitamaru, H. Veno, K. Morikawa, M. Tanaka, M. Miura-Mattausch, H.I. Mattausch, S. Kumashiro, T. Yamaguchi, K. Yamashita, N. Nakayama: "Vth-Model of Pocket-Implant MOSFETs for Circuit Simulation"; Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 392 - 395.
K. Matsuzawa, K. Uchida, A. Nishiyama, T. Numata, M. Noguchi: "Device Simulation and Measurement of Hybrid SBTT"; Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 380 - 383.
A. Pakfar, A. Poncet, T. Schwartzmann, H. Jaouen: "A Unified Model of Dopant Diffusion in SiGe"; Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 62 - 65.
C. Ravariu, F. Ravariu, A. Rusu, D. Dobrescu, L. Dobrescu: "The Modeling of a SOl Micro-Electromechanical Sensor"; Poster: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 328 - 331.
K. Sonoda, M. Tanizawa, K. Eikyu, K. Ishikawa, T. Kumamoto, H. Kouno, M. Inuishi: "Modeling of Bias Dependent Fluctuations of Flicker Noise of MOSFETs"; Talk: Conference, Athens, Greece; 2001-09-05 - 2001-09-07; in: "Proc. of SISPAD", (2001), 3-211-83708-6; 190 - 193.