H. Kosina, G. Kaiblinger-Grujin, S. Selberherr: "A New Approach to Ionized-Impurity Scattering"; Talk: Conference, Cambridge, MA, USA; 1997-09-08 - 1997-09-10; in: "Proc. of SISPAD", (1997), 0-7803-3775-1; 205 - 208.
G. Le Carval, P. Scheiblin, A. Poncet, P. Rivallin: "Methodology for Predictive Calibration of TCAD Simulators"; Talk: Conference, Cambridge, MA, USA; 1997-09-08 - 1997-09-10; in: "Proc. of SISPAD", (1997), 0-7803-3775-1; 177 - 180.
H. Rucker, B. Heinemann, W. Ropke, G. Fischer, G. Lippert, H.J. Osten: "Modeling the Effect of Carbon on Boron Diffusion"; Poster: Conference, Cambridge, MA, USA; 1997-09-08 - 1997-09-10; in: "Proc. of SISPAD", (1997), 0-7803-3775-1; 281 - 284.
K. Vasanth, M. Nandakumar, M. Rodder, S. Sridhar, P.K. Mozumder, I.- C. Chen: "A Pocket Implant Model for Sub-0.18 Micron CMOS Process Flows"; Talk: Conference, Cambridge, MA, USA; 1997-09-08 - 1997-09-10; in: "Proc. of SISPAD", (1997), 0-7803-3775-1; 181 - 184.