2008 International Conference on Simulation of Semiconductor Processes and Devices
September 9 – 11, 2008
Yumoto Fujiya
Hotel, Hakone, JAPAN
http://www.yumotofujiya.jp/en/index.html
Co-sponsored
by
In cooperation with |
Japan
Society of Applied Physics
IEEE Electron Devices Society Osaka University Global COE Program "Center for Electronic Device Innovation" Keio University Global COE Program "High-Level Global Cooperation for Leading-Edge Platform on Access Spaces" IEEE EDS Japan Chapter IEEE EDS Kansai Chapter The Institute of Electronics, Information and Communication Engineers |
Announcement of Special Events: | |||
Companion Workshop | gWorkshop on Compact Modelinghwill beheld on September 8, 2008. gImpact of METROLOGY on TCADhwill be held on September 8, 2008. Appropriate measurements are inevitable to guarantee validity of TCAD and develop advance models. Impact of metrology on TCAD is one of key issues for modeling of aggressively scaled-down semiconductor devices. This workshop is intended to provide overview and discussion concerning metrology by invited speakers who are leading experts in the field. |
Advance Registration Deadline : July 31, 2008 Hotel Reservation Deadline : July 31, 2008 |