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SISPAD 2004

September 2-4, 2004, Munich, Germany

ieee

eds

Scope and Topics




Scope

 
The conference provides an opportunity for the presentation of recent advances in modeling and simulation of semiconductor devices, processes and equipment for manufacturing.


Topics include
  • Device simulation including quantum effects and nanodevices in silicon and compound semiconductors
  • Process modeling and simulation including both continuum and atomistic approaches
  • Equipment, topography and lithography simulation
  • Circuit modeling including interconnects
  • Integration of process, device and circuit simulation
  • High performance computing and advanced numerical methods
  • Compact modeling and integration of device/circuit simulation 
  • Simulation of mechatronical micro- and nanodevices
  • Calibration of models and verification and benchmarking of simulators