2008 International Conference on Simulation of Semiconductor Processes and Devices
September 9 – 11, 2008
Yumoto Fujiya Hotel, Hakone, JAPAN
In cooperation with
Japan Society of Applied Physics
IEEE Electron Devices Society
Osaka University Global COE Program
"Center for Electronic Device Innovation"
Keio University Global COE Program
"High-Level Global Cooperation for Leading-Edge Platform
on Access Spaces"
IEEE EDS Japan Chapter
IEEE EDS Kansai Chapter
The Institute of Electronics, Information and Communication Engineers
|Announcement of Special Events:|
|Companion Workshop||gWorkshop on Compact Modelinghwill beheld on September 8, 2008.
gImpact of METROLOGY on TCADhwill be held on September 8, 2008.
Appropriate measurements are inevitable to guarantee validity of TCAD and develop
advance models. Impact of metrology on TCAD is one of key issues for modeling of
aggressively scaled-down semiconductor devices. This workshop is intended to provide
overview and discussion concerning metrology by invited speakers who are leading
experts in the field.
|Advance Registration Deadline : July 31, 2008
Hotel Reservation Deadline : July 31, 2008